In the power system, to reduce reactive power loss, shunt capacitor banks are typically used to improve the power factor. In practical applications, the failure rate of capacitor compensation devices is relatively high, which is determined by the operating characteristics of capacitor devices. Therefore, it is very important to regularly inspect capacitor devices, detect capacitor defects early, and avoid fault expansion. In the field, capacitors are usually connected in parallel in groups, so using a general capacitance meter requires disconnecting the leads before measurement, which is labor-intensive and prone to wiring errors. The L8100 fully automatic capacitance and inductance tester developed by our company can measure individual capacitors in a parallel group without disconnecting the wires, and it can also measure inductance and current. It is easy to connect, simple to operate, and greatly improves the efficiency of field testing. It also avoids the possibility of errors caused by disassembling and assembling leads.
Main functions and features of the instrument
Capacitance measurement: The instrument can test individual capacitors in a group without disconnecting wires, making testing convenient. It displays the capacitance test results along with the test voltage, current, power, and frequency.
Inductance measurement: The instrument displays the measured inductance value and simultaneously shows the applied voltage, current, power, and frequency during measurement.
Current measurement: It displays the current and its frequency simultaneously.
The instrument features a large LCD screen, Chinese menu, Chinese prompts, and simple operation.
The instrument comes with a built-in printer that can print displayed data, and has built-in memory that does not lose data when power is off. The instrument can store 20 sets of data.
Permanent calendar and clock functions, with time calibration capability.
The test power supply is equipped with overcurrent protection, and a short circuit of the power output will not damage the instrument.
Main technical specifications
